A 2–40 GHz Probe Station Based Setup for On-Wafer Antenna Measurements-Reference-Cited by-同舟云学术

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A 2–40 GHz Probe Station Based Setup for On-Wafer Antenna Measurements

Published:2008-10 Issue:10 Volume:56 Page:3241-3247
ISSN:0018-926X
Container-title:IEEE Transactions on Antennas and Propagation
language:
Short-container-title:IEEE Trans. Antennas Propagat.

Author:

Van Caekenberghe Koen,Brakora Kenneth M.,Hong Wonbin,Jumani Karan,Liao DaHan,Rangwala Mustafa,Wee Yun-Zhen,Zhu Xinen,Sarabandi Kamal

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/8/4636813/04636854.pdf?arnumber=4636854

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Characterisation of a D-Band Horn Antenna: Comparison of Near-Field and OTA Measurements;2024 18th European Conference on Antennas and Propagation (EuCAP);2024-03-17

3. Characterization and De-Embedding of Wafer Probe Radiation for Integrated Antenna Measurements;IEEE Transactions on Antennas and Propagation;2023-12

4. Robotic Radiation Pattern Measurement System for 6–110 GHz Based in Both Near Field and Far Field;2023 IEEE International Opportunity Research Scholars Symposium (ORSS);2023-04-23

5. Terahertz Antenna-in-Package Design and Measurement for 6G Communications System;IEEE Transactions on Antennas and Propagation;2023

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