Research on Testing Methods for Memory Data Abnormal Bit Flipping of Relay Protection Devices Under Radiation Impact

Author:

Zhao Qianyun1,Zhou Hualiang1,Li Youjun1,Zou Zhiyang1

Affiliation:

1. NARI Group Corparation,Nanjing,Jiangsu,China

Publisher

IEEE

Reference18 articles.

1. Error-tolerant design and application of relay protection device against unexpeced memory bit change;Li;Automation of Electric Power Systems,2021

2. Analysis and counter measures of single event upset soft errors in a relay protection device;Zhou;Power System Protection and Control,2021

3. Test method and failure rate of the single-paricle effect of a relay protecion device;Ding;Power System Protection and Control,2022

4. Software and hardware platform technology of an independent controllable relay protection device;Zhong;Power System Protection and Control,2022

5. Challenges and development prospects of rely protecion technology;Chen;Automation of Electric Power Systems,2017

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