Packaging and Characterization of an Ultra Compact 1200V PCB SiC MOSFET Half-Bridge Module
Author:
Affiliation:
1. Semiconductor Power Electronics Center (SPEC), The University of Texas at Austin,Austin,Texas,USA
2. University of Missouri,Columbia,Missouri,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10131044/10130846/10131178.pdf?arnumber=10131178
Reference13 articles.
1. Measurement of the Transient Thermal Impedance of MOSFETs Over the Sensitivity of the Threshold Voltage;maximilian;2018 20th European Conference on Power Electronics and Applications (EPE‘18 ECCE Europe),0
2. Driver Integrated Online Rds-on Monitoring Method for SiC Power Converters
3. Temperature measurements of semiconductor devices - a review
4. FF23MR12W1M1_B11 datasheet;Infineon,2018
5. An Accurate Subcircuit Model of SiC Half-Bridge Module for Switching-Loss Optimization
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1. Thermal cycling characterization of an integrated low-inductance GaN eHEMT power module;Microelectronics Reliability;2024-10
2. A PCB-Embedded 1.2 kV SiC MOSFET Package With Reduced Manufacturing Complexity;IEEE Open Journal of Power Electronics;2023
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