AANet: Aggregation and Alignment Network with Semi-hard Positive Sample Mining for Hierarchical Place Recognition

Author:

Lu Feng1,Zhang Lijun2,Dong Shuting1,Chen Baifan3,Yuan Chun1

Affiliation:

1. Tsinghua Shenzhen International Graduate School, Tsinghua University,Shenzhen,China,518055

2. Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences,Chongqing,China,400714

3. School of Automation, Central South University,Changsha,China,410083

Publisher

IEEE

Reference43 articles.

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5. FAB-MAP: Probabilistic Localization and Mapping in the Space of Appearance

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