Novel FDSOI-based Dynamic XNOR Logic for Ultra-Dense Highly-Efficient Computing

Author:

Kumar Shubham1,Chatterjee Swetaki1,Dabhi Chetan Kumar2,Amrouch Hussam3,Chauhan Yogesh Singh1

Affiliation:

1. Indian Institute of Technology Kanpur,Electrical Engineering Department,Kanpur,India,208016

2. University of California,Electrical Engineering Department,Berkely,CA,USA,94720

3. University of Stuttgart,Chair of Semiconductor Test and Reliability (STAR),Stuttgart,Germany

Publisher

IEEE

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. FeFET Reliability Modeling for In-Memory Computing: Challenges, Perspective, and Emerging Trends;IEEE Transactions on Electron Devices;2024-01

2. Programmable Delay Element Using Dual-Port FeFET for Post-Silicon Clock Tuning;IEEE Electron Device Letters;2023-11

3. Invited Paper: Ultra-Efficient Edge AI Using FeFET-based Monolithic 3D Integration;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28

4. Frontiers in AI Acceleration: From Approximate Computing to FeFET Monolithic 3D Integration;2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC);2023-10-16

5. First demonstration of in-memory computing crossbar using multi-level Cell FeFET;Nature Communications;2023-10-10

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