First CE Matters: On the Importance of Long Term Properties on Memory Failure Prediction
Author:
Affiliation:
1. Technical University Berlin,Berlin,Germany
2. Huawei Munich Research,Munich,Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10020192/10020156/10020671.pdf?arnumber=10020671
Reference11 articles.
1. Cost-Aware Prediction of Uncorrected DRAM Errors in the Field
2. Predicting DRAM reliability in the field with machine learning
3. Revisiting Memory Errors in Large-Scale Production Data Centers: Analysis and Modeling of New Trends from the Field
4. A white paper on the benefits of chipkill correct ecc for pcserver main memory;dell,1997
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