Author:
Chakravadhanula Krishna,Chickermane Vivek,Cunningham Paul,Foutz Brian,Meehl Dale,Milano Louis,Papameletis Christos,Scott David,Wilcox Steev
Cited by
11 articles.
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2. Generation of Two-Cycle Tests for Structurally Similar Circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-02
3. Testability Evaluation for Local Design Modifications;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-01
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