Author:
Moghaddam Elham,Mukherjee Nilanjan,Rajski Janusz,Tyszer Jerzy,Zawada Justyna
Cited by
7 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A Storage Based LBIST Scheme for Logic Diagnosis;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
3. 7nm Complex Networking ASIC Test Coverage improvement by COBST (Control point Observe point-Based Structural Testing);2023 IEEE International Symposium on Smart Electronic Systems (iSES);2023-12-18
4. Fully Deterministic Storage Based Logic Built-In Self-Test;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
5. PPA Optimization of Test Points in Automotive Designs;2022 IEEE International Test Conference (ITC);2022-09