Improving Analog Functional Safety Using Data-Driven Anomaly Detection
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx7/8610502/8624670/08624716.pdf?arnumber=8624716
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits;2023 IEEE International Test Conference (ITC);2023-10-07
2. Unsupervised Learning-based Early Anomaly Detection in AMS Circuits of Automotive SoCs;2022 IEEE International Test Conference (ITC);2022-09
3. Efficient and Robust Resistive Open Defect Detection Based on Unsupervised Deep Learning;2022 IEEE International Test Conference (ITC);2022-09
4. A Duty-Cycle Monitor Supporting A Wide Frequency Range of Clock Signal;2021 IEEE International Test Conference in Asia (ITC-Asia);2021-08-18
5. A Distributed Error and Anomaly Communication Architecture for Analog and Mixed-Signal Systems;Journal of Electronic Testing;2019-06
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