Author:
Sauer Matthias,Kupferschmid Stefan,Czutro Alexander,Polian Ilia,Reddy Sudhakar,Becker Bernd
Cited by
22 articles.
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1. Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03
2. Functional Compaction for Functional Test Sequences;IEEE Access;2024
3. Test Sequences for Faults in the Scan Logic;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-10
4. Topological Heuristics for Scan Test Overhead Reduction;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
5. Broad-Brush Compaction for Sequential Test Generation;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2020-08