Beta Factor Mapping of Individual Emitting Tips During Integral Operation of Field Emission Arrays-Reference-Cited by-同舟云学术

Beta Factor Mapping of Individual Emitting Tips During Integral Operation of Field Emission Arrays

Published:2023-07-10 Issue: Volume: Page:
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Container-title:2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)
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Author:

Schels Andreas¹,Herdl Florian¹,Hausladen Matthias²,Wohlfartsstätter Dominik³,Bachmann Michael³,Edler Simon³,Düsberg Felix³,Pahlke Andreas³,Buchner Philipp²,Schreiner Rupert²,Hansch Walter¹

Affiliation:

1. University of the Bundeswehr Munich, Institute of Physics,GERMANY

2. Ostbayerische Technische Hochschule,Regensburg,GERMANY

3. KETEK GmbH,Munich,GERMANY

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10188930/10188876/10188957.pdf?arnumber=10188957

Reference7 articles.

1. The Murphy–Good plot: a better method of analysing field emission data

2. In situ quantitative field emission imaging using a low-cost CMOS imaging sensor

3. Advanced field emission measurement techniques for research on modern cold cathode materials and their applications for transmission-type x-ray sources

4. Silicon field emitters fabricated by dicing-saw and wet-chemical-etching;edler;J Vac Sci Technol B,2021

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