Accurate characterization of SiO<sub>2</sub> thin films using surface acoustic waves-Reference-Cited by-同舟云学术

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Accurate characterization of SiO₂ thin films using surface acoustic waves

Published:2015-04 Issue:4 Volume:62 Page:736-743
ISSN:0885-3010
Container-title:IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
language:
Short-container-title:IEEE Trans. Ultrason., Ferroelect., Freq. Contr.

Author:

Knapp Matthias,Lomonosov Alexey M.,Warkentin Paul,Jager Philipp M.,Ruile Werner,Kirschner Hans-Peter,Honal Matthias,Bleyl Ingo,Mayer Andreas P.,Reindl Leonhard M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Acoustics and Ultrasonics,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/58/7081331/07081469.pdf?arnumber=7081469

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Investigation of acoustoelastic surface acoustic waves in prestressed media;Journal of Sound and Vibration;2024-02

2. FEM Modeling of Electro-Acoustic Nonlinearities in Surface Acoustic Wave Devices: A Methodological Review;Acoustics;2023-08-07

3. Nonlinear Finite Element Calculations of Layered SAW Resonators;IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control;2023-04

4. The Study of the Acoustic Characteristics of Chitosan Acetate Film Using a Radial Electric Field Excited Resonator;Sensors;2023-02-06

5. Synchrosqueezed wavelet transform-based method for characterizing the dispersive nature of laser-excited surface acoustic waves propagating through the coated or damaged medium;Measurement;2021-11

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