Machine Learning for Plant Disease Incidence and Severity Measurements from Leaf Images-Reference-Cited by-同舟云学术

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Machine Learning for Plant Disease Incidence and Severity Measurements from Leaf Images

Published:2016-12 Issue: Volume: Page:
ISSN:
Container-title:2016 15th IEEE International Conference on Machine Learning and Applications (ICMLA)
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Author:

Mwebaze Ernest,Owomugisha Godliver

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7835817/7838104/07838138.pdf?arnumber=7838138

Cited by 38 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Artificial intelligence approach for diagnosing banana crop diseases through image processing framework: an insightful survey journey from farmers field to digital cloud;Archives of Phytopathology and Plant Protection;2024-02-07

3. Bean Leaf Lesions Image Classification: A Robust Ensemble Deep Learning Approach;2024 ASU International Conference in Emerging Technologies for Sustainability and Intelligent Systems (ICETSIS);2024-01-28

4. Plant Leaf Disease Identification and Classification using Deep Learning Technique;International Journal of Advanced Research in Science, Communication and Technology;2024-01-20

5. HECNNet: Hybrid Ensemble Convolutional Neural Network Model with Multi-Backbone Feature Extractors for Soybean Disease Classification;2024 2nd International Conference on Intelligent Data Communication Technologies and Internet of Things (IDCIoT);2024-01-04

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