A new method for using /sup 252/Cf in SEU testing (SRAM)-Reference-Cited by-同舟云学术

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A new method for using /sup 252/Cf in SEU testing (SRAM)

Published:1990-12 Issue:6 Volume:37 Page:1916-1922
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Costantine A.,Howard J.W.,Becker M.,Block R.C.,Smith L.S.,Soli G.A.,Stauber M.C.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx1/23/3156/00101209.pdf?arnumber=101209

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Single-event effects ground testing and on-orbit rate prediction methods: the past, present, and future;IEEE Transactions on Nuclear Science;2003-06

2. Laboratory tests for single-event effects;IEEE Transactions on Nuclear Science;1996-04

3. Advanced qualification techniques [microelectronics];IEEE Transactions on Nuclear Science;1994-06

4. Radiation-hardened microelectronics for space applications;Radiation Physics and Chemistry;1994-01

5. Upset due to a single particle caused propagated transient in a bulk CMOS microprocessor;IEEE Transactions on Nuclear Science;1991-12

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