Bayesian Approach for Two-Phase Degradation Data Based on Change-Point Wiener Process With Measurement Errors
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx7/24/8370165/08281548.pdf?arnumber=8281548
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