Diffusivity of Moisture in Thin Films
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx5/4208411/4208412/04208458.pdf?arnumber=4208458
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4. Interfacial Diffusivity of Moisture Along A SiO2/Tin Interface Measured Using Imaging Secondary Ion Mass Spectroscopy (SIMS);MRS Proceedings;1999
5. Polymer/metal Interfaces in Interconnect Structures: Moisture Diffusion and Stress Corrosion Effects;MRS Proceedings;1998
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