Vₜ Extraction Methodologies Influence Process Induced Vₜ Variability: Does This Fact Still Hold for Advanced Technology Nodes?
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Published:2020-11
Issue:11
Volume:67
Page:4691-4695
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ISSN:0018-9383
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Container-title:IEEE Transactions on Electron Devices
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language:
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Short-container-title:IEEE Trans. Electron Devices
Author:
Bhoir Mandar S.ORCID,
Chiarella Thomas,
Mitard Jerome,
Horiguchi Naoto,
Mohapatra Nihar RanjanORCID
Funder
Visvesvaraya Ph.D. Scheme, MeitY, Government of India MEITY-PHD-250
Horizon 2020 ASCENT EU Project
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials