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Divergence-Based Robust Inference Under Proportional Hazards Model for One-Shot Device Life-Test

  • Published:2021-12 Issue:4 Volume:70 Page:1355-1367
  • ISSN:0018-9529
  • Container-title:IEEE Transactions on Reliability
  • language:
  • Short-container-title:IEEE Trans. Rel.

Author:

Balakrishnan NarayanaswamyORCID,Castilla ElenaORCID,Martin NirianORCID,Pardo LeandroORCID

Funder

Ministerio de Economía y Competitividad

Ministerio de Educación, Cultura y Deporte

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks;Journal of Computational and Applied Mathematics;2024-02

2. A complex Jensen–Shannon divergence in complex evidence theory with its application in multi-source information fusion;Engineering Applications of Artificial Intelligence;2022-11

3. Misspecification of copula for one-shot devices under constant stress accelerated life-tests;Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability;2022-07-07

4. One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications;Reliability Engineering & System Safety;2022-05

5. A semi-quantum approach for modelling the accelerated test data;Applied Mathematical Modelling;2022-04
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