Knowledge Transfer Framework for PVT Robustness in Analog Integrated Circuits-Reference-Cited by-同舟云学术

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Knowledge Transfer Framework for PVT Robustness in Analog Integrated Circuits

Published:2024 Issue: Volume: Page:1-14
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Li Jintao¹^ORCID,Zeng Yanhan¹^ORCID,Zhi Haochang²^ORCID,Yang Jingci¹^ORCID,Shan Weiwei²^ORCID,Li Yongfu³^ORCID,Li Yun⁴^ORCID

Affiliation:

1. School of Electronics and Communication Engineering, Guangzhou University, Guangzhou, China

2. School of Electronic Science and Engineering, Southeast University, Nanjing, China

3. Department of Micro-Nano Electronics, Shanghai Jiao Tong University, Shanghai, China

4. Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen, China

Funder

Natural Science Foundation of China (Grant No

Natural Science Foundation of Guangdong Province

Science and Technology Project of Guangzhou

Ministry of Science and Technology of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture

Link

http://xplorestaging.ieee.org/ielx7/8919/4358591/10362966.pdf?arnumber=10362966

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Variation-aware automated design and optimization of sub-1V bandgap voltage reference;Microelectronics Journal;2024-10

2. Machine learning driven global optimisation framework for analog circuit design;Microelectronics Journal;2024-09

3. The application of deep learning technology in integrated circuit design;Energy Informatics;2024-08-29

4. Robust circuit optimization under PVT variations via weight optimization problem reformulation;Expert Systems with Applications;2024-08

5. Growing NAS for Complex-Valued CNNs in Digital Predistortion Power Amplifier Applications;2024 International Joint Conference on Neural Networks (IJCNN);2024-06-30

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