A Highly Stable Physically Unclonable Function Using Algorithm-Based Mismatch Hardening Technique in 28-nm CMOS-Reference-Cited by-同舟云学术

A Highly Stable Physically Unclonable Function Using Algorithm-Based Mismatch Hardening Technique in 28-nm CMOS

Published:2023-01 Issue:1 Volume:70 Page:280-289
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Yang Shao-Hong¹^ORCID,Liu Tsung-Te¹^ORCID

Affiliation:

1. Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan

Funder

Ministry of Science and Technology, Taiwan

Intelligent and Sustainable Medical Electronics Research Fund in National Taiwan University

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture

Link

http://xplorestaging.ieee.org/ielx7/8919/10025563/09942277.pdf?arnumber=9942277

Reference28 articles.

1. A 0.5-V Hybrid SRAM Physically Unclonable Function Using Hot Carrier Injection Burn-In for Stability Reinforcement

2. 8.7 physically unclonable function for secure key generation with a key error rate of 2E-38 in 45 nm smart-card chips;karpinskyy;IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers,2016

3. Ultra-Compact and Robust Physically Unclonable Function Based on Voltage-Compensated Proportional-to-Absolute-Temperature Voltage Generators

4. Physically unclonable function in 28 nm FDSOI technology achieving high reliability for AEC-Q 100 grade 1 and ISO 26262 ASIL-B;choi;IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers,2020

5. A Self-Regulated and Reconfigurable CMOS Physically Unclonable Function Featuring Zero-Overhead Stabilization

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