Mismatch Analysis of DTCs With an Improved BIST-TDC in 28-nm CMOS-Reference-Cited by-同舟云学术

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Mismatch Analysis of DTCs With an Improved BIST-TDC in 28-nm CMOS

Published:2022-01 Issue:1 Volume:69 Page:196-206
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Chen Peng^ORCID,Yin Jun^ORCID,Zhang Feifei,Mak Pui-In^ORCID,Martins Rui P.^ORCID,Staszewski Robert Bogdan^ORCID

Funder

Science Foundation Ireland

Science and Technology Development Fund, Macau SAR

University of Macau

National Science Center, Poland

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/8919/9684154/09524358.pdf?arnumber=9524358

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