A 6T SRAM Based Two-Dimensional Configurable Challenge-Response PUF for Portable Devices
Author:
Affiliation:
1. Institute of Microelectronics, Agency for Science, Technology and Research, Singapore
2. Samsung Electronics, Hwaseong, South Korea
3. Electrical and Electronic Engineering Department, Nanyang Technological University, Singapore
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture
Link
http://xplorestaging.ieee.org/ielx7/8919/9782465/09737288.pdf?arnumber=9737288
Reference22 articles.
1. A Sequence-Dependent Configurable PUF Based on 6T SRAM for Enhanced Challenge Response Space
2. Controlling the Reliability of SRAM PUFs With Directed NBTI Aging and Recovery
3. Design of SRAM PUF with improved uniformity and reliability utilizing device aging effect
4. 16.2 A 0.19pJ/b PVT-variation-tolerant hybrid physically unclonable function circuit for 100% stable secure key generation in 22nm CMOS
5. A technique to transform 6T-SRAM arrays into robust analog PUF with minimal overhead
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