Accurate and Fast On-Wafer Test Circuitry Integrated With a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT
Author:
Funder
Ministry of Science and Technology, Taiwan
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/8919/9684154/09456006.pdf?arnumber=9456006
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