Accurate and Fast On-Wafer Test Circuitry Integrated With a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT

Author:

Lin Long-YiORCID,Hong Hao-ChiaoORCID

Funder

Ministry of Science and Technology, Taiwan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Parametric Faults in Computing-in-Memory Applications of a 4kb Read-Decoupled 8T SRAM Array in 40nm CMOS;2023 IEEE International Test Conference in Asia (ITC-Asia);2023-09-12

2. Test Circuit Design for Accurately Characterizing Cells’ Output Currents in a Read-Decoupled 8T SRAM Array for Computing-in-Memory Applications;2023 35th International Conference on Microelectronic Test Structure (ICMTS);2023-03-27

3. Heavy-duty diesel vehicle formation with transient integrated control of fuel consumption and emission in an intelligent network environment;Proceedings of the Institution of Mechanical Engineers, Part I: Journal of Systems and Control Engineering;2022-09-03

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