Test Program Generation for Communication Peripherals in Processor-Based SoC Devices-Reference-Cited by-同舟云学术

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Test Program Generation for Communication Peripherals in Processor-Based SoC Devices

Published:2009-03 Issue:2 Volume:26 Page:52-63
ISSN:0740-7475
Container-title:IEEE Design & Test of Computers
language:
Short-container-title:IEEE Des. Test. Comput.

Author:

Apostolakis Andreas,Gizopoulos Dimitris,Psarakis Mihalis,Ravotto Danilo,Reorda Matteo Sonza

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx5/54/4850397/04850411.pdf?arnumber=4850411

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Recent Trends and Perspectives on Defect-Oriented Testing;2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS);2022-09-12

2. A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers;Electronics;2022-08-09

3. Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries;2022 IEEE European Test Symposium (ETS);2022-05-23

4. Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries;2022 IEEE 40th VLSI Test Symposium (VTS);2022-04-25

5. Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement;2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS);2021-06-28

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