Phase Noise and Jitter Measurements in SEU-Hardened CMOS Phase Locked Loop Design-Reference-Cited by-同舟云学术

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Phase Noise and Jitter Measurements in SEU-Hardened CMOS Phase Locked Loop Design

Published:2021-04-21 Issue: Volume: Page:
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Container-title:2021 IEEE International IOT, Electronics and Mechatronics Conference (IEMTRONICS)
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Author:

Adesina Naheem Olakunle,Srivastava Ashok,Ullah Khan Md Azmot,Xu Jian

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9422411/9422480/09422482.pdf?arnumber=9422482

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