Superior Short-Circuit Performance of SiC Superjunction MOSFET
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9163811/9170028/09170126.pdf?arnumber=9170126
Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Analysis of On-State and Short-Circuit Capability in 3D Trench SiC MOSFET Designs;Solid State Phenomena;2024-08-21
2. SiC superjunction MOSFET with Schottky diode for improving short-circuit and reverse recovery ruggedness;Micro and Nanostructures;2024-07
3. 3D Van der Pauw Device for MOS Channel Characterization on 4H-SiC Trench Sidewalls;IEEE Electron Device Letters;2024-04
4. Comparison of 1.2 kV SiC Superjunction MOSFETs Formed by Multi-epitaxial Growth and Trench-filling Epitaxial Growth;IEEJ Transactions on Electronics, Information and Systems;2024-03-01
5. Comparison of electronic stopping cross sections for channeled implantation of Al ions between the 〈0001〉 and 〈11 2¯ 3〉 directions in 4H-SiC;Japanese Journal of Applied Physics;2024-01-01
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