Average depths of electron penetration. II. Angular dependence and use to evaluate secondary-electron yield by photons
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Published:1999-08
Issue:4
Volume:46
Page:910-914
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ISSN:0018-9499
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Container-title:IEEE Transactions on Nuclear Science
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language:
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Short-container-title:IEEE Trans. Nucl. Sci.
Author:
Lazurik V.,Moskvin V.,Rogov Y.,Tabata T.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
2 articles.
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2. Electrons;An Introduction to the Passage of Energetic Particles through Matter;2006-11-10