From Reliability to Resilience: More Than Just Taking One Step Further-Reference-Cited by-同舟云学术

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From Reliability to Resilience: More Than Just Taking One Step Further

Published:2023 Issue: Volume: Page:1-5
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:
Short-container-title:IEEE Trans. Rel.

Author:

Cheng Yao¹^ORCID,Liao Haitao²^ORCID,Elsayed Elsayed A.³^ORCID

Affiliation:

1. Department of Industrial and Manufacturing Systems Engineering, The University of Hong Kong, Hong Kong

2. Department of Industrial Engineering, University of Arkansas, Fayetteville, AR, USA

3. Department of Industrial and Systems Engineering, Rutgers University, Piscataway, NJ, USA

Funder

Command, Control and Interoperability Center for Advanced Data Analysis

Rutgers University from the Center for Accelerating Operational Efficiency (CAOE) at Arizona State University

U.S. Department of Homeland Security to Arizona State University

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx7/24/4378406/10324842.pdf?arnumber=10324842

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