Simulation Analysis of the Bit Error Induced by EMI on Galvanically Isolated Data-Link Embedded in an Automotive Battery Management IC
Author:
Affiliation:
1. Politecnico di Torino,Department of Electronics and Telecommunications,Turin,Italy
2. ADG - Smart Power R&D STMicroelectronics,Milan,Italy
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10297584/10297612/10297892.pdf?arnumber=10297892
Reference14 articles.
1. Operational amplifier immune to EMI with no baseband performance degradation
2. An EMI resistant integrated LVDS transmitter in 0.18µm CMOS
3. Digital Suppression of EMI-Induced Errors in a Baseband Acquisition Front-End including Off-the-Shelf, EMI-Sensitive Operational Amplifiers
4. Investigation on the susceptibility of two-stage voltage comparators to EMI;fiori;2011 8th Workshop on Electromagnetic Compatibility of Integrated Circuits EMC Compo,2011
5. IC digital input highly immune to EMI
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