Automatic Metric Search for Few-Shot Learning-Reference-Cited by-同舟云学术

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Automatic Metric Search for Few-Shot Learning

Published:2023 Issue: Volume: Page:1-12
ISSN:2162-237X
Container-title:IEEE Transactions on Neural Networks and Learning Systems
language:
Short-container-title:IEEE Trans. Neural Netw. Learning Syst.

Author:

Zhou Yuan¹^ORCID,Hao Jieke¹,Huo Shuwei¹^ORCID,Wang Boyu²^ORCID,Ge Leijiao¹^ORCID,Kung Sun-Yuan³^ORCID

Affiliation:

1. School of Electrical and Information Engineering, Tianjin University, Tianjin, China

2. Department of Computer Science and the Brain Mind Institute, University of Western Ontario, London, Canada

3. Department of Electrical Engineering, Princeton University, Princeton, NJ, USA

Funder

National Key Research and Development Program of China

National Natural Science Foun-dation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Artificial Intelligence,Computer Networks and Communications,Computer Science Applications,Software

Link

http://xplorestaging.ieee.org/ielx7/5962385/6104215/10040944.pdf?arnumber=10040944

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Class-Irrelevant Feature Removal for Few-Shot Image Classification;IEEE Transactions on Neural Networks and Learning Systems;2024

2. Meta-Modulation: A General Learning Framework for Cross-Task Adaptation;IEEE Transactions on Neural Networks and Learning Systems;2024

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