Degradation of oxides and oxynitrides under hot hole stress-Reference-Cited by-同舟云学术

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Degradation of oxides and oxynitrides under hot hole stress

Published:2000 Issue:2 Volume:47 Page:378-386
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Zhang J.F.,Sii H.K.,Groesendeken G.,Degraeve R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/17819/00822284.pdf?arnumber=822284

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