Parasitic Interactions with Intermediate Substrates and Methods to Mitigate their Impact: A Case Study in Voltage Protection ICs-Reference-Cited by-同舟云学术

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Parasitic Interactions with Intermediate Substrates and Methods to Mitigate their Impact: A Case Study in Voltage Protection ICs

Published:2022-02 Issue: Volume: Page:
ISSN:
Container-title:2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)
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Author:

Soundararajan Srinivasa Prasad¹,Gee Harry¹,Whitworth Adam²

Affiliation:

1. Power Solutions Group onsemi,Bangalore,India

2. fomerly of Power Solutions Group onsemi,Santa Clara,USA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9885796/9885734/09885972.pdf?arnumber=9885972

Reference6 articles.

1. Multi-ring active analogic protection for minority carrier injection suppression in smart power technology

2. How to Switch Inductive Loads with Demagnetization;long;Application Note 6307 Maxim Integrated (Now a part of Analog Devices),0

3. Fifty Nifty Variations of Two-Transistor Circuits: A tribute to the versatility of MOSFETs

4. The Floating NBL Architecture: Enabler of a Quasi-SOI process

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