Defect Detection in Transparent Materials Based on Optical Coherence Tomography
Author:
Affiliation:
1. Shandong Jianzhu University,School of Science,Jinan,China,250101
2. Laser Institute, Qilu University of Technology (Shandong Academy of Sciences),Jinan,China,250104
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10235976/10235997/10236112.pdf?arnumber=10236112
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5. Nonlinear optical imaging of defects in cubic silicon carbide epilayers;hristu;Scientific Reports,2014
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