Analytical and Measurement-Based Method for Voltage Fault Injection of CAN Chip Security

Author:

Wang Naiye1,Qu Chenbing1,Hou Bo1,Wang Liwei1,Sun Chen1

Affiliation:

1. China Electronic Product Reliability and Environmental Testing Research Institute,Science and Technology on Reliability Physics and Application of Electronic Component Laboratory,Guangzhou,China

Funder

Research and Development

National Natural Science Foundation of China

Publisher

IEEE

Reference11 articles.

1. Research and Prospect of Fault Injection Technology;li;Mechanical Engineer,2016

2. Design of Fault Injection Platform Based on CAN Bus;hong;Digital Technology and Application,2017

3. Comparison of physical and software-implemented fault injection techniques

4. CDSK Modulator and Demodulator System Based on FPAA Technology

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