Keep the Bursts and Ditch the Interleavers
Author:
Affiliation:
1. Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA
2. Hamilton Institute, Maynooth University, Kildare, Ireland
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/26/9796992/09766201.pdf?arnumber=9766201
Reference43 articles.
1. Shift-register synthesis and BCH decoding
2. Soft Maximum Likelihood Decoding using GRAND
3. Ordered Reliability Bits Guessing Random Additive Noise Decoding
4. Guessing Random Additive Noise Decoding With Symbol Reliability Information (SRGRAND)
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