On the Optimality of Binning for Distributed Hypothesis Testing-Reference-Cited by-同舟云学术

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On the Optimality of Binning for Distributed Hypothesis Testing

Published:2012-10 Issue:10 Volume:58 Page:6282-6303
ISSN:0018-9448
Container-title:IEEE Transactions on Information Theory
language:
Short-container-title:IEEE Trans. Inform. Theory

Author:

Rahman Md. Saifur,Wagner Aaron B.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Library and Information Sciences,Computer Science Applications,Information Systems

Link

http://xplorestaging.ieee.org/ielx5/18/6299030/06257491.pdf?arnumber=6257491

Cited by 39 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dynamic Defect Detection in Fast, Robust NDE Methods by Transfer Learning Based Optimally Binned Hypothesis Tests;Research in Nondestructive Evaluation;2024-02-28

2. Optimal Error Exponent of Type-Based Distributed Hypothesis Testing over AWGN Channels;2023 59th Annual Allerton Conference on Communication, Control, and Computing (Allerton);2023-09-26

3. Error-Exponent of Distributed Hypothesis Testing for Gilbert-Elliot Source Models;2023 12th International Symposium on Topics in Coding (ISTC);2023-09-04

4. Multi-Hop Network With Multiple Decision Centers Under Expected-Rate Constraints;IEEE Transactions on Information Theory;2023-07

5. Distributed Hypothesis Testing over a Noisy Channel: Error-Exponents Trade-Off;Entropy;2023-02-06

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