Investigation of the effects of Pulsed Direct Current at low frequencies on the Electromigration Lifetime : Student Paper-Reference-Cited by-同舟云学术

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Investigation of the effects of Pulsed Direct Current at low frequencies on the Electromigration Lifetime : Student Paper

Published:2018-10 Issue: Volume: Page:
ISSN:
Container-title:2018 International Integrated Reliability Workshop (IIRW)
language:
Short-container-title:

Author:

Passage Jennifer M.,Rogalskyj Sophia,Azhari Nabihah,Wilcox Eric,Lloyd J.R.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8719393/8727065/08727088.pdf?arnumber=8727088

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Pulsed Power Electromigration in Copper Metallization (10 Hz – 4 MHz);2023 IEEE International Integrated Reliability Workshop (IIRW);2023-10-08

2. Black’s Law in Light of Low Frequency Pulsed Power Electromigration;2022 IEEE International Integrated Reliability Workshop (IIRW);2022-10-09

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