Robust ultra-low voltage ROM design
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/4665385/4671999/04672110.pdf?arnumber=4672110
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Output Load Capacitance Scaling-Based Energy-Efficient Design of ROM on 28 nm FPGA;Proceedings of Second International Conference on Computing, Communications, and Cyber-Security;2021
2. Ultra-Fast Current Mode Sense Amplifier for Small $$I_{\mathrm{CELL}}$$ I CELL SRAM in FinFET with Improved Offset Tolerance;Circuits, Systems, and Signal Processing;2015-11-24
3. Smart User Authentication for an Improved Data Privacy;Studies in Computational Intelligence;2014-08-22
4. 28 nm 50% Power-Reducing Contacted Mask Read Only Memory Macro With 0.72-ns Read Access Time Using 2T Pair Bitcell and Dynamic Column Source Bias Control Technique;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2014-03
5. An Offset-Tolerant Fast-Random-Read Current-Sampling-Based Sense Amplifier for Small-Cell-Current Nonvolatile Memory;IEEE Journal of Solid-State Circuits;2013-03
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