Author:
Barlow R. E.,Hunter L. C.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Cited by
8 articles.
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1. Preliminaries;Reliability Analysis and Plans for Successive Testing;2021
2. Bibliography;Reliability Analysis and Plans for Successive Testing;2021
3. Optimal series–parallel topology of multi-state system with two failure modes;Reliability Engineering & System Safety;2002-07
4. Structure optimization of multi-state system with two failure modes;Reliability Engineering & System Safety;2001-04
5. Systems with two dual failure modes — A survey;Microelectronics Reliability;1993-08