Heap Fuzzing: Automatic Garbage Collection Testing with Expert-Guided Random Events-Reference-Cited by-同舟云学术

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Heap Fuzzing: Automatic Garbage Collection Testing with Expert-Guided Random Events

Published:2023-04 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE Conference on Software Testing, Verification and Validation (ICST)
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Author:

Polito Guillermo¹,Tesone Pablo¹,Palumbo Nahuel¹,Ducasse Stéphane¹,Privat Jean²

Affiliation:

1. RMoD Univ. Lille, Inria,CNRS, Centrale Lille, UMR 9189 CRIStAL,Lille,France,F-59000

2. Université du Québec à Montréal,Montreal,Quebec,Canada

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10132156/10132162/10132213.pdf?arnumber=10132213

Reference38 articles.

1. Relaxing safely: verified on-the-fly garbage collection for x86-TSO

2. Automatic Exploit Generation for Buffer Overflow Vulnerabilities

3. Towards a Model Checking Framework for a New Collector Framework

4. Automatic generation of control flow hijacking exploits for software vulnerabilities;heelan;PhD thesis,2009

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1. OptiFeat: Enhancing Feature Selection, A Hybrid Approach Combining Subject Matter Expertise and Recursive Feature Elimination Method;2024-08-13

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