Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
22 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. References;Plasma and Current Instabilities in Semiconductors;1981
2. Second breakdown and damage in junction devices;IEEE Transactions on Electron Devices;1973-08
3. Switching and breakdown in films;Thin Solid Films;1971-03
4. Thermal instability in very small p-n junctions;IEEE Transactions on Electron Devices;1970-09
5. Thermal feedback in power semiconductor devices;IEEE Transactions on Electron Devices;1970-09