Electromagnetic Shielding Analysis of Planar Materials Using ASTM D4935 Standard Fixture

Author:

Park Hyun Ho1ORCID

Affiliation:

1. School of Electrical and Electronic Engineering, University of Suwon, Hwaseong, South Korea

Funder

Institute of Information & Communications Technology Planning & Evaluation

Korea Government

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Reference23 articles.

1. Thin-Film Shielding for Microcircuit Applications and a Useful Laboratory Tool for Plane-Wave Shielding Evaluations

2. The influence of the test fixture on shielding effectiveness measurements

3. The failure of coaxial TEM cells ASTM standards methods in H.F. range

4. Analysis of two different transmission-line holder systems for shielding effectiveness measurements of conductive material samples part I: Capacitive coupled TLH;kuhn;Proc IEEE Int Symp Electromagn Compat,0

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