Stacking-Based Deep Neural Network: Deep Analytic Network for Pattern Classification-Reference-Cited by-同舟云学术

Stacking-Based Deep Neural Network: Deep Analytic Network for Pattern Classification

Published:2020-12 Issue:12 Volume:50 Page:5021-5034
ISSN:2168-2267
Container-title:IEEE Transactions on Cybernetics
language:
Short-container-title:IEEE Trans. Cybern.

Author:

Low Cheng-Yaw^ORCID,Park Jaewoo,Teoh Andrew Beng-Jin^ORCID

Funder

National Research Foundation of Korea (NRF) grant

Korea Government

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Human-Computer Interaction,Information Systems,Control and Systems Engineering,Software

Link

http://xplorestaging.ieee.org/ielx7/6221036/9279348/08694849.pdf?arnumber=8694849

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