A Method to Detect Bit Flips in a Soft-Error Resilient TCAM-Reference-Cited by-同舟云学术

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A Method to Detect Bit Flips in a Soft-Error Resilient TCAM

Published:2018-06 Issue:6 Volume:37 Page:1185-1196
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Syafalni Infall^ORCID,Sasao Tsutomu,Wen Xiaoqing

Funder

JSPS KAKENHI

JSPS Grant-in-Aid for the Promotions of Bilateral Joint Research Projects (Japan-Germany)

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx7/43/8360974/08023790.pdf?arnumber=8023790

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. FPGA IMPLEMENTATION OF ERROR DETECTION AND CORRECTION IN SRAM EMULATED TCAMS;2022 International Conference on Recent Trends in Microelectronics, Automation, Computing and Communications Systems (ICMACC);2022-12-28

2. Error Correction Scheme with Decimal Matrix Code for SRAM Emulation TCAMs;Smart Innovation, Systems and Technologies;2022

3. Toward Tolerating Soft Errors for Network Data Packets;Lecture Notes in Networks and Systems;2022

4. Efficient soft error resiliency by multi-match packet classification using scalable TCAM implementation in FPGA;Microprocessors and Microsystems;2020-04

5. Error Detection and Correction in SRAM Emulated TCAMs;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-02

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