Author:
Cheng-Yung Chiang ,Huey-Ru Chuang
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Cited by
2 articles.
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1. Pulsed I
/V
and S
-parameters measurement system for isodynamic characterization of power GaN HEMT transistors;International Journal of RF and Microwave Computer-Aided Engineering;2018-08-31
2. Load Pull;High Efficiency RF and Microwave Solid State Power Amplifiers;2009-09-03