1. Self-Test Library Generation for In-Field Test of Path Delay Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. Topping Off Test Sets Under Bounded Transparent Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-01
3. Equivalent Faults under Launch-on-Shift (LOS) Tests with Equal Primary Input Vectors;ACM Transactions on Design Automation of Electronic Systems;2021-04
4. Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-02
5. RETRO: Reintroducing Tests for Improved Reverse Order Fault Simulation;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2020-08