Author:
Wen X.,Enokimoto K.,Miyase K.,Yamato Y.,Kochte M. A.,Kajihara S.,Girard P.,Tehranipoor M.
Cited by
20 articles.
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1. Power-Aware Testing in the Era of IoT;2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT);2022-10-25
2. A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test;IEEE Journal on Emerging and Selected Topics in Circuits and Systems;2018-09
3. Timing-Accurate Estimation of IR-Drop Impact on Logic- and Clock-Paths During At-Speed Scan Test;2016 IEEE 25th Asian Test Symposium (ATS);2016-11
4. An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing;2016 IEEE 25th Asian Test Symposium (ATS);2016-11
5. On the Switching Activity in Faulty Circuits During Test Application;2016 IEEE 25th Asian Test Symposium (ATS);2016-11