1. Department of RF & Microwave Engineering, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany, marius.richter@hf.uni-bremen.de
2. Fraunhofer Institute for Reliability and Microintegration, Gustav-Meyer-Allee 25, 13355 Berlin, Germany, karl-friedrich.becker@izm.fraunhofer.de
3. Fraunhofer Institute for Reliability and Microintegration, Gustav-Meyer-Allee 25, 13355 Berlin, Germany, lars.boettcher@izm.fraunhofer.de
4. Department of RF & Microwave Engineering, University of Bremen, Otto-Hahn-Allee, 28359 Bremen, Germany, martin.schneider@hf.uni-bremen.de