Electromagnetic Fault Injection as a New Forensic Approach for SoCs-Reference-Cited by-同舟云学术

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Electromagnetic Fault Injection as a New Forensic Approach for SoCs

Published:2020-12-06 Issue: Volume: Page:
ISSN:
Container-title:2020 IEEE International Workshop on Information Forensics and Security (WIFS)
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Author:

Gaine Clement,Aboulkassimi Driss,Pontie Simon,Nikolovski Jean-Pierre,Dutertre Jean-Max

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9360831/9360880/09360902.pdf?arnumber=9360902

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Exploration of System-on-Chip Secure-Boot Vulnerability to Fault-Injection by Side-Channel Analysis;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

2. Fault Injection on Embedded Neural Networks: Impact of a Single Instruction Skip;2023 26th Euromicro Conference on Digital System Design (DSD);2023-09-06

3. Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack;2023 Design, Automation & Test in Europe Conference & Exhibition (DATE);2023-04

4. Analysis of EM Fault Injection on Bit-sliced Number Theoretic Transform Software in Dilithium;ACM Transactions on Embedded Computing Systems;2023-03-31

5. Combined Fault Injection and Real-Time Side-Channel Analysis for Android Secure-Boot Bypassing;Smart Card Research and Advanced Applications;2023

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