Electromagnetic Fault Injection as a New Forensic Approach for SoCs
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9360831/9360880/09360902.pdf?arnumber=9360902
Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Exploration of System-on-Chip Secure-Boot Vulnerability to Fault-Injection by Side-Channel Analysis;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
2. Fault Model Analysis of DRAM under Electromagnetic Fault Injection Attack;2023 Design, Automation & Test in Europe Conference & Exhibition (DATE);2023-04
3. Combined Fault Injection and Real-Time Side-Channel Analysis for Android Secure-Boot Bypassing;Smart Card Research and Advanced Applications;2023
4. Efficient Attack-Surface Exploration for Electromagnetic Fault Injection;Constructive Side-Channel Analysis and Secure Design;2023
5. Instruction-Fetching Attack and Practice in Collision Fault Attack on AES;Symmetry;2022-10-19
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