Bayesian Analysis of Pareto Reliability With Dependent Masked Data
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx5/24/5338641/05196699.pdf?arnumber=5196699
Cited by 19 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Masked Data Analyses of Reliability Systems Under Accelerated Life Testing;Risk, Reliability and Safety Engineering;2024
2. Maintenance optimization of a two‐component series system considering masked causes of failure;Quality and Reliability Engineering International;2023-08-09
3. Multiple imputation of masked competing risks data using machine learning algorithms;Journal of Statistical Computation and Simulation;2022-04-18
4. Computation offloading for object-oriented applications in a UAV-based edge-cloud environment;The Journal of Supercomputing;2022-01-28
5. Analysis of masked data with Lindley failure model;Communications in Statistics - Simulation and Computation;2021-03-09
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